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High Speed IC Handler NS8000 Series

High Speed IC Handler NS8000 Series

Features

  • High stability
    • Stable handling for Small packages
    • Jam Rate 0/5,000 - 1/10,000
  • Easy operation and easy maintenance
    • Visual screen for operation
    • Easy access for changeover and Maintenance
  • Compatibility of the changeover kit for NS-6000 series and NS-7000 series
    • Contact us for more information

NS-8000


NS8000 series specifications

  NS-8020 NS-8040 NS-8080H NS-8080 NS-8080W
Device type QFP, TSOP, CSP, WLCSP, BGA, QFN, PLCC, LGA, PGA,
Min. 3x3 to Max. 50x50 (Lead pitch: 0.4 mm or more) *1
Test mode Square 4-site (2x2)
In-Line 4-site (4x1)
2-site
Busy Shuttle(Single)
8-site (4x2)
Square 4-site (2x2)
In-Line 4-site (4x1)
2-site
Busy Shuttle (Single)
Testing area 184 mm x 130 mm 260 mm x 130 mm
Standard socket pitch (mm) X:80 Y:60 X:40 Y:60 X:40 Y:60 / X:60 Y:60
Heating method Heating Plate Chamber
Index time 0.39 sec or more
(Ambient/High temperature) *2
0.36 sec or more
(Ambient/High temperature) *2
Throughput 5,400 8,000 8,300 8,300 8,200
Tray classification Max. 6 classification
(3 auto loaders, 3 manual loaders)
Max. 5 classification
(3 auto loaders, 2 manual loaders)
Tray JEDEC (135.9 x 315.0) mm
Temperature accuracy +50degC to + 90degC ±2degC *3
+90degC to + 130degC ±3degC *3
Power Single phase AC 200 to 240 V 50/60 Hz 6kVA
Dimension (mm) 1700(W) x 1500(D) x 1760(H) *4 1860(W) x 1500(D) x 1760(H) *4
Weight Approx. 920Kg Approx. 960Kg Approx. 1,020Kg

*1 Depends on the socket size and socket pitch.
*2 Depends on the socket mounting height.
*3 Contact us for temperature accuracy of NS-8080H 8-site.
*4 Excluding the handle, tower light, LCD monitor.

IC Test Handler for 16-Site NS-8160W Series

Features

  • The wide type handler testing 16 devices at once and keeping basic performance of NS-8000 series.
  • NS-8160SW feature a wider socket opening space than NS-8160W.
  • Optimum for the memory enbedded IC testing such as Flash microcomputer.

NS-8160 series specifications

NS-8160W NS-8160SW (Super wide)
Device type QFP, TSOP, CSP, WLCSP, BGA, QFN, PLCC, LGA, PGA,
Min. 3x3 to Max. 50x50 (Lead pitch: 0.4 mm or more) *1
Test mode 16-site (8x2)
8-site (4x2)
Square 4-site (2x2)
In-Line 4-site (4x1)
2-site
1-site
Testing area 260 mm x 130 mm 340 mm x 130 mm
Standard socket pitch (mm) X:30 Y:60 (16-site) X:40 Y:60 (16-site)
Heating method Chamber
Index time 0.40 sec or more (Ambient/High temperature) *2
Throughput (UPH) 8300
Tray classification Max. 5 classification
(3 auto loaders, 2 manual loaders)
Max. 5 classification
(3 auto loaders, 1.5 manual loaders) *3
Tray JEDEC (135.9 x 315.0)mm
Hot plate size 160 x 340 mm 2 plates (Standard) or 220 x 380mm 1 plate
220 x 380 mm 2 plates (Option) (Input Arm's operating area 220 x 340mm)
Max. contact force 850 N (Standard) or 2,400 N (Option) 2,400 N
Temperature accuracy +50degC to +90degC  ±2degC
+90degC to +130degC  ±3degC
Power Single phase AC 200 to 240V 50/60 Hz 6kVA
Dimension (mm) 1860(W) x 1500(D) x 1760(H) *4 1860(W) x 1500(D) x 2140(H) *4
Weight Approx. 1,040 kg Approx. 1,070 kg

*1 Depends on the socket size and socket pitch.
*2 Depends on the socket mounting height.
*3 One of the manual loaders: Half part is availabe (up to 105 mm).
*4 Excluding the handle, tower light, LCD monitor.

Please contact us.